[B3]: Ahmet F Budak, David Z Pan, Hao Chen, Keren Zhu, Mingjie Liu, Mohamed Baker Alawieh, Shuhan Zhang, Wei Shi and Xiyuan Tang. “CAD for Analog/Mixed‐Signal Integrated Circuits,”  In: Advances in Semiconductor Technologies: Selected Topics Beyond Conventional CMOS. John Wiley & Sons, Inc, 2022.

[B2]: Wei Ye, Mohamed Baker Alawieh, Che-Lun Hsu, Yibo Lin, and David Z. Pan. “Dealing with Aging and Yield in Scaled Technologies,” In:Dependable Embedded Systems. Springer, 2021. | pdf  

[B1]: Handi Yu, Weijing Shi, Mohamed Baker Alawieh, Changhao Yan, Xuan Zeng, Xin Li and Huafeng Yu, “Efficient Statistical Validation of Autonomous Driving Systems,” In: Safe, Autonomous and Intelligent Vehicles. Springer, 2019. | pdf  

[J12]: Jing Chen, Yufeng Guo, Mohamed Baker Alawieh, Maolin Zhang, Jun Zhang and David Z. Pan, "An Efficient Automatic Structure Design Method of Silicon on Insulator Lateral Power Device Considering RESURF Constraint,"  IEEE Transactions on Electron Devices, 2021.

[J11]: Jing Chen, Mohamed Baker Alawieh, Yibo Lin, Maolin Zhang, Jun Zhang, Yufeng Guo and David Z. Pan, “Automatic Selection of Structure Parameters of SOI LDMOS Using Bayesian Optimization”, IEEE Electron Device Letters, 2020. 

[J10]: Mohamed Baker Alawieh, Yibo Lin, Zaiwei Zhang, Meng Li, Qixing Huang and David Z. Pan, “GAN-SRAF: Sub-Resolution Assist Feature Generation using Generative Adversarial Networks,” IEEE Trans. on Computer Aided Design (TCAD), 2020. | pdf

[J9]: Ali M. Alaouie and Mohamed Baker Alawieh, “Critical Evaluation of Single Point Measurement-Based Quantitative Analyses in Forensic Breath Alcohol”, Forensic Science International: Reports, 2020. | pdf

[J8]: Jing Chen, Mohamed Baker Alawieh, Yibo Lin, Maolin Zhang, Jun Zhang, Yufeng Guo and David Z. Pan, “PowerNet: SOI Lateral Power Device Breakdown Prediction with Deep Neural Networks”, IEEE Access, 2020. | pdf

[J7]: Mohamed Baker Alawieh, Yibo Lin, Wei Ye and David Z. Pan, “Generative Learning in VLSI Design for Manufacturability: Current Status and Future Directions”,  Journal of Microelectronic Manufacturing (JOMM), 2019. | pdf

[J6] : Ali Alawieh, Fadi Zaraket, Mohamed Baker Alawieh, Arindam Rano Chatterjee and Alejandro Spiotta, “Using Machine Learning to Optimize Selection of Elderly Patients for Endovascular Thrombectomy,”  Journal of NeuroInterventional Surgery (JNIS), 2019. | pdf

[J5] : Jing Chen, Yibo Lin, Yufeng Guo, Maolin Zhang, Mohamed Baker Alawieh and David Z. Pan, “Lithography Hotspot Detection using a Double Inception Module Architecture”, Jounral of Micro/Nanolithography, MEMS, and MOEMS (JM3), 2019. | pdf

[J4] : Minhee Jun, Rohit Negi, Shihui Yin, Mohamed Baker Alawieh, Fa Wang, Megha Sunny, Tamal Mukherjee and Xin Li, “Environmental-Adaptive Fast Multi-Resolution (EAF-MR) Optimization in Large-Scale RF-FPGA Systems,” EURASIP Journal on Wireless Communications and Networking, 2018. | pdf

[J3] : Mohamed Baker Alawieh, Fa Wang and Xin Li, “Efficient Hierarchical Performance Modeling for Analog and Mixed Signal Circuits via Bayesian Co-Learning,” IEEE Trans. on Computer Aided Design (TCAD), 2018. | pdf

[J2] : Weijing Shi, Mohamed Baker Alawieh, Xin Li and Huafeng Yu, “Algorithm and Hardware Implementation for Visual Perception System in Autonomous Vehicles: A Survey,” Integration, the VLSI Journal, 2017. | pdf

[J1] : Mohamed Baker Alawieh, Fa Wang and Xin Li, “Identifying Systematic Spatial Failure Patterns via Unsupervised Learning,” IEEE Trans. on Computer Aided Design (TCAD), 2017. | pdf

[C20]:  Rachel Selina Rajarathnam, Mohamed Baker Alawieh, Zixuan Jiang, Mahesh Iyer and David Z. Pan, "DREAMPlaceFPGA: an open-source analytical placer for large scale heterogeneous FPGAs using deep-learning toolkit," IEEE/ACM Asian and South Pacific Design Automation Conference (ASP-DAC), 2022.

[C19]: Mohamed Baker Alawieh and David Z. Pan, “ADAPT: An Adaptive Machine Learning Framework with Application to Lithography Hotspot Detection,” ACM/IEEE Workshop on Machine Learning for CAD (MLCAD), 2021. 

[C18]: Mohamed Baker Alawieh, Wei  Ye and David Z. Pan, “Re-examining VLSI Manufacturing and Yield through the Lens of Deep Learning,” International Conference on Computer Aided Design (ICCAD), 2020. | (Invited Talk)

[C17]: Mohamed Baker Alawieh, Duane Boning and David Z. Pan, “Wafer Map Defect Patterns Classification using Deep Selective Learning,” Design Automation Conference (DAC), 2020. | pdf 

[C16] : Wei Ye, Mohamed Baker Alawieh, Yuki Watanabe, Shigeki Nojima, Yibo Lin and David Z. Pan, “TEMPO: Fast Mask Topography Effect Modeling with Deep Learning,” ACM International Symposium on Physical Design (ISPD), 2020.  | pdf (Best Paper Award)

[C15] : Ali Alawieh, Mohamed Baker Alawieh, Fadi Zaraket, Robert M Starke, Arindam Rano Chatterjee, Aquilla Turk, Reade De Leacy, Ansaar T Rai, Kyle Fargen, Peter Kan, Jasmeet Singh, Lukas Vilella, Fábio Nascimento, Travis M Dumont, David McCarthy and Alejandro Spiotta “Multicenter Validation of SPOT, an Artificial Intelligence Based Tool, to Optimize Selection of Elderly Stroke Patients for Mechanical Thrombectomy - Insights From the STAR Collaboration,” International Stroke Conference (ISC), 2020. | pdf

[C14] : Mohamed Baker Alawieh, Wuxi Li, Yibo Lin, Love Singhal, Mahesh Iyer and David Z. Pan, “High-Definition Routing Congestion Prediction for Large-Scale FPGAs,” Asian and South Pacific Design Automation Conference (ASPDAC), 2020. | pdf

[C13] : Jing Chen, Yufeng Guo, Yibo Lin, Mohamed Baker Alawieh, Maolin Zhang, Jun Zhang and David Z. Pan, “Breakdown Voltage Prediction of SOI Lateral Power Device Using Deep Neural Network,” Cross Strait Quad-Regional Radio Science and Wireless Technology Conference, 2019. | pdf

[C12] : Mohamed Baker Alawieh, Yibo Lin, Zaiwei Zhang, Meng Li, Qixing Huang and David Z. Pan, “GAN-SRAF: Sub-Resolution Assist Feature Generation using Conditional Generative Adversarial Networks,” Design Automation Conference (DAC), 2019. | pdf

[C11] : Mohamed Baker Alawieh, Sinead Williamson and David Z. Pan, “Rethinking Sparsity in Performance Modeling for Analog and Mixed Circuits using Spike and Slab Models,” Design Automation Conference (DAC), 2019. | pdf 

[C10] : Wei Ye, Mohamed Baker Alawieh, Yibo Lin and David Z. Pan, “LithoGAN: End-to-end Lithography Modeling with Generative Adversarial Networks,” Design Automation Conference (DAC), 2019. | pdf (Best Paper Nomination)

[C9] : Wei Ye, Mohamed Baker Alawieh, Meng Li, Yibo Lin and David Z. Pan, “Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection,” IEEE/ACM Design, Automation & Test in Europe (DATE), 2019. | pdf

[C8] : Mohamed Baker Alawieh, Xiyuan Tang and David Z. Pan, “S2-PM: Semi-Supervised Learning for Efficient Performance Modeling of Analog and Mixed Signal Circuits,” IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), 2019. | pdf 

[C7] : Wei Ye, Mohamed Baker Alawieh, Yibo Lin and David Z. Pan, “Tackling Signal Electromigration with Learning-Based Detection and Multistage Mitigation,” IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), 2019. | pdf

[C6] : Yibo Lin, Mohamed Baker Alawieh, Wei Ye and David Z. Pan, “Machine Learning for Yield Learning and Optimization,” International Test Conference (ITC), 2018. | pdf

[C5] : Mohamed Baker Alawieh, Fa Wang and Xin Li, “ Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning”, Design Automation Conference (DAC), 2017. | pdf

[C4] : Mohamed Baker Alawieh, Fa Wang, Shihui Yin, Minhee Jun, Xin Li, Tamal Mukherjee and Rohit Negi, “Efficient Programming for Reconfiguration Radio Frequency (RF) Systems”, International Conference on Computer Aided Design (ICCAD), 2017. | pdf

[C3] : Weijing Shi, Mohamed Baker Alawieh, Xin Li, Huafeng Yu, Nikos Arechiga and Nobuyuki Tomatsu, “Efficient Statistical Validation of Machine Learning Systems for Autonomous Driving,” International Conference on Computer-Aided Design (ICCAD), 2016. | pdf

[C2] : Mohamed Baker Alawieh, Fa Wang and Xin Li, “Identifying Systematic Spatial Failure Patterns through Wafer Clustering,” IEEE International Symposium on Circuits and Systems (ISCAS), 2016. | pdf

[C1] : Mohamed Baker Alawieh, Fa Wang, Rouwaida Kanj, Xin Li and Rajiv Joshi, “Efficient Analog Circuit Optimization using Sparse Regression and Error Margining,” IEEE International Symposium on Quality Electronic Design (ISQED), 2016. | pdf 

[P1] : “Intelligent Fail Recognition”, Bryan G. Hickerson, Mohamed Baker Alawieh, Brian L. Kozitza , John R. Reysa, Erica Stuecheli, Sep. 8 , 2020.

[P2]: “Clustering simulation failures for triage and debugging”, Bryan G Hickerson, John Reysa, Mohamed Baker Alawieh, Brian Kozitza, Erica Stuecheli, Tuhin Mahmud, Divya Joshi, Dec. 21, 2021.

[T1] : “GAN-SRAF: Sub-Resolution Assist Feature Generation using Conditional Generative Adversarial Networks,” @ Synopsys, Austin, Dec. 2019.